Get our free email newsletter

Testing

Product Insights: Charged Device Model ESD Testing

This blog explains CDM ESD testing using the field-induced (FI) method, which is important for semiconductor manufacturers. It covers building a CDM-FI tester, waveform details and verification, and qualification nuances. 

Electric Shock Stimulation for Complex Leakage Current Waveforms

Leakage or touch current tests for electrical shock protection is mandated by safety standards in the process of issuing a safety certification for various electrical products. In this article, electrical shock sensation experiments were conducted for a complex waveform composed of a combination of 60 Hz and a higher frequency sinusoidal signal.

Creating an Effective and Defensible Product Recall

Recalls can create huge problems for manufacturers and product sellers. They can generate new product liability lawsuits that are harder to defend, involve a significant financial cost to implement, and create reputational problems with consumers and retailers. Manufacturers must carefully design a recall or other corrective action that is as effective as possible and adequate under the circumstances. Various government entities are issuing new requirements that can help with these efforts.

Challenges of CDM Modeling for High-Speed Interface Devices

The behavior of ultra-high-speed interfaces is complex, involving fast-rise time waveforms and on-die transient phenomena that cause device failure at lower CDM levels.

Using a Near-Field Probe to Troubleshoot Transient Failures

Solving EMI problems isn’t only about ensuring that a product can meet EMC regulations and standards (although it’s a significant part of the job). Another crucial reason for addressing EMI issues is to enhance product reliability, especially when a product operates in public or industrial areas where there are many different types of noise sources.
- From Our Sponsors -

IT Server Hardware Compliance, Part 2

This two-part article provides a detailed overview of hardware compliance issues applicable to mainframe and server computers and their subcomponents.

Measurement Uncertainties in Outdoor Far-Field Antenna Ranges

This article presents a framework for assessing the measurement uncertainties on an outdoor far‑field elevated range.

IT Server Hardware Compliance, Part 1

This two-part article provides a detailed overview of hardware compliance issues applicable to mainframe and server computers and their subcomponents.

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part 2

The trend of progressively migrating both ESD and EMC immunity from the system/board to the component level is creating unprecedented challenges for the component ESD designer.

What Every Electronics Engineer Needs to Know About: Working with EMC Test Labs

Choosing an EMC test lab to work with is one of the most important decisions any electronics design engineer or product developer has to make.
- From Our Sponsors -

Digital Sponsors

Become a Sponsor

Discover new products, review technical whitepapers, read the latest compliance news, trending engineering news, and weekly recall alerts.

Get our email updates

What's New

- From Our Sponsors -

Sign up for the In Compliance Email Newsletter

Discover new products, review technical whitepapers, read the latest compliance news, trending engineering news, and weekly recall alerts.