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Consolidated methodologies have long been established to assess measurement uncertainties in both near-field and compact-range antenna measurements. However, there is currently no analogous methodology for outdoor far-field measurement facilities. This article presents a framework for assessing the measurement uncertainties on an outdoor far‑field elevated range.
Measurement Uncertainties in Outdoor Far-Field Antenna Ranges

Consolidated methodologies have long been established to assess measurement uncertainties in both near-field and compact-range antenna measurements. However, there is currently no analogous methodology for outdoor far-field measurement facilities. This article presents a framework for assessing the measurement uncertainties on an outdoor far‑field elevated range.

This two-part article provides a detailed overview of hardware compliance issues applicable to mainframe and server computers and their subcomponents.
IT Server Hardware Compliance, Part 1

This two-part article provides a detailed overview of hardware compliance issues applicable to mainframe and server computers and their subcomponents.

The trend of progressively migrating both ESD and EMC immunity from the system/board to the component level is creating unprecedented challenges for the component ESD designer. Implications of EMC-ESD immunity co-design will be reviewed along with several case studies.
ESD Designers’ Headache with Multiple Automotive Test Requirements, Part 2

The trend of progressively migrating both ESD and EMC immunity from the system/board to the component level is creating unprecedented challenges for the component ESD designer. Implications of EMC-ESD immunity co-design will be reviewed along with several case studies.

Choosing an EMC test lab to work with is one of the most important decisions any electronics design engineer or product developer has to make.
What Every Electronics Engineer Needs to Know About: Working with EMC Test Labs

Choosing an EMC test lab to work with is one of the most important decisions any electronics design engineer or product developer has to make.

This is the third article of a three-article series devoted to the correlation between the insertion loss and input impedance of passive EMC filters.
Correlation Between Insertion Loss and Input Impedance of EMC Filters, Part 3: Cascaded LC and CL Filters

This is the third article of a three-article series devoted to the correlation between the insertion loss and input impedance of passive EMC filters.

This column focuses on the practical aspects of implementing embedded ESD detection. We’ll provide a step-by-step guide, discuss validation and testing methodologies, present case studies, and delve into future trends and innovations in the field.
Implementing Embedded ESD Detection, Part 2

This column focuses on the practical aspects of implementing embedded ESD detection. We’ll provide a step-by-step guide, discuss validation and testing methodologies, present case studies, and delve into future trends and innovations in the field.

Occasionally, we are asked to help develop shielding effective for near-field low-frequency (LF) magnetic fields, perhaps in a situation where some regulatory agency has imposed limits on LF magnetic field emissions of our product, and we are forced to comply.
Low-Frequency Magnetic Field Shielding

Occasionally, we are asked to help develop shielding effective for near-field low-frequency (LF) magnetic fields, perhaps in a situation where some regulatory agency has imposed limits on LF magnetic field emissions of our product, and we are forced to comply.

The narrow ESD design window in current FinFET technologies creates a special challenge for the robust ESD design of high-speed interfaces. Smart circuit-ESD co-design can help achieve the required ESD robustness without deteriorating functional performance.
ESD Co-Design for High-Speed SerDes in FinFET Technologies

The narrow ESD design window in current FinFET technologies creates a special challenge for the robust ESD design of high-speed interfaces. Smart circuit-ESD co-design can help achieve the required ESD robustness without deteriorating functional performance.

The world of non-food consumer products has undergone significant changes over the past two decades. New technologies and online sales are the primary drivers behind the upcoming new Product Safety law, which is set to bring about a substantial transformation in the landscape of product safety when it takes effect by the end of 2024.
The EU’s New Product Safety Law Will Be a Game Changer

The world of non-food consumer products has undergone significant changes over the past two decades. New technologies and online sales are the primary drivers behind the upcoming new Product Safety law, which is set to bring about a substantial transformation in the landscape of product safety when it takes effect by the end of 2024.

This article presents methods for building reduced-order models (ROMs) based on proper orthogonal decomposition (POD) for modeling transient heat transfer in partially-perfuse tissue in prolonged contact with a heat-generating wearable device.
Reduced-Order Modeling of Pennes’ Bioheat Equation for Thermal Dose Analysis

This article presents methods for building reduced-order models (ROMs) based on proper orthogonal decomposition (POD) for modeling transient heat transfer in partially-perfuse tissue in prolonged contact with a heat-generating wearable device.

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