Secure facility designs often comingle ICS/ICD-705 and NSA 94-106 design requirements, creating project confusion with significant design and cost implications. This article focuses on bringing some clarity to the differences between ICS/ICD-705 design guidance and NSA 94-106 performance requirements. The related secure facility design and construction process is also reviewed.
This article presents the EMC design techniques for electric vehicle powertrain modules. High voltage EMC regulations for powertrain modules are reviewed first to help understand associated design challenges. The design techniques are then demonstrated in detail to help engineers design a module that will pass the EMC requirements in the test chamber.
The electronic industry has embraced simulation to address several complex design challenges, but reliability is still mostly dealt with best design practices and tested with prototypes. In this article, we present how modeling and simulation approaches can help designers perform virtual prototyping and uncover reliability issues especially EOS/ESD before going for physical prototypes.
In Part 2 of this two-part article, we’ll discuss the development and use of isolated bonding networks (IBNs).
In Part 1 of this two-part article, we’ll discuss the development of “grounding networks” and the shift to meshed structures to reduce damage from overvoltages. Part 2 will appear in our November 2020 issue.
Robust ESD protection does not ensure that IC designs are protected from unintended EOS effects. This article identifies areas of risk in some ESD design methods.
OEMs are moving toward the digitalization of the design and integration of electrical and electronic systems in aerospace applications. This approach to design development may help aerospace OEMs avoid possible calamities in the future.
This article outlines the instrumentation and calculations performed to evaluate the severity of the exposure risk to unfiltered artificial light.
This article highlights key concepts to designing electrostatic discharge (ESD) protection circuits for radio frequency (RF) and millimeter wave applications. Needed RF concepts are discussed and some popular protection schemes are illustrated.
TCAD simulation can identify ESD relevant effects and the internal operation of a device under ESD stress conditions that are not generally accessible through conventional measurement techniques. TCAD simulation can help to reduce IC and device design cycle times, resulting in the more timely introduction of innovative products to market.