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Streaming HD Video at 10,000 Times Lower Power

Researchers from the University of Washington have created a new method for HD streaming that cuts down on energy use and doesn't require a plug.

SMPS Input Filter Design: Negative Resistance Approach

This article discusses a practical approach to designing an input filter to the switch-mode power supply (SMPS).

Lighting the Way for The Next Era of Silicon Microelectronics

Scientists unveil new microchip technology that enables photonic communication in consumer electronics.

Generalized Formula for the Calculation of a Probabilistic Metric for Random Hardware Failures in Redundant Systems

ISO 26262 defines the probabilistic metric for random hardware failures (PMHF) as the average probability of a violation of a safety goal associated with a failure over a vehicle’s lifetime and architecture metrics. In this article, we propose a method to calculate the PMHF and expand the application to redundant subsystems that are not adequately described in the standard.

What Every Electronics Engineer Needs to Know About: Training

The wonderful thing about engineering is that there is always something new to learn. This can also be a bad thing if we do not know how to go about it or lack a clear direction.
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Dealing with EMI in Semiconductor Manufacturing: Part II

Enter SEMI E176-1017. It places the focus not on limited types of emission from any particular equipment, but on EMI in the overall manufacturing environment and in key locations where it specifically matters.

Twenty-First Century Document Management

Design plans, engineering drawings, production procedures, safety memoranda, and marketing strategies can significantly help or hurt a manufacturer or product seller, especially in the event of product liability litigation.

How To Correctly Perform System Level ESD Testing of High-Speed Interface Boards

It is no trivial matter to properly interpret system level test results on high-speed boards. Board manufacturers (OEMs) assess the ESD robustness of their system by means of gun testing, not always in accordance with the IEC standard.

ESD Measurement Methods Affected by Manufacturing Changes

Static control methods may be tested according to industry standards, but additional process risk assessment methods are needed to assure that the static control elements have been successful in mitigating the ESD risks.

Banana Skins – May 2018 (#54-61)

We are proud to carry on the tradition of sharing Banana Skins for the purpose of promoting education for EMI/EMC engineers.
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