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Expert Insights

Product Qualification in an ESD Control Program

Section 7.3 in ANSI/ESD S20.20–2014 includes a requirement for a product qualification plan.

Banana Skins – June 2018 (#62-67)

We are pleased to bring you Banana Skins, a new monthly column in In Compliance, and a 20-year tradition that began in the pages of the EMC Journal. We hope you enjoy the column and look forward to continuing the tradition of sharing these valuable stories.

SMPS Input Filter Design: Negative Resistance Approach

This article discusses a practical approach to designing an input filter to the switch-mode power supply (SMPS).

What Every Electronics Engineer Needs to Know About: Training

The wonderful thing about engineering is that there is always something new to learn. This can also be a bad thing if we do not know how to go about it or lack a clear direction.

ESD Measurement Methods Affected by Manufacturing Changes

Static control methods may be tested according to industry standards, but additional process risk assessment methods are needed to assure that the static control elements have been successful in mitigating the ESD risks.
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Banana Skins – May 2018 (#54-61)

We are proud to carry on the tradition of sharing Banana Skins for the purpose of promoting education for EMI/EMC engineers.

Near-Field Shield Effectiveness Evaluation Using H-Field Probe

We compare the shielding effectiveness of various solid metallic shields by direct H-field measurements in the near field of the source.

Passive Filters Can Be Unconventionally Saturated

Usually HF filters are designed using inductors with cores. In this way a medium/high inductance value is obtained in small size components. But using cores has a limitation.

Consistency and Your Labels

This month, read our interview with Angela Lambert, Clarion’s head of standards compliance, to...

ANSI/ESD STM11.11-2015 Surface Resistance Measurements of Static Dissipative Planar Materials

ANSI/ESD STM 11.11-2015 was developed to fulfil a need to measure static dissipative planar materials not provided for by existing ASTM resistivity measurement methods.
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