Testing

More power costs more money when it comes to broadband power amplifiers, so we typically only specify/buy to meet our current needs rather than what we may need in the future.

The voltage based CDM classification has practically no meaning for IP qualification. In this article, we propose an alternative CDM qualification, which is based on a peak current criterion.

In this article we will address less mainstream, non-typical EMC test chambers that are often used in automotive, military, and other pre-compliance types of test environments.

Should I use the pin combinations in Table 2A or Table 2B per Human Body Model (HBM) standard JS-001?

This article looks at some of the reasons why the filters you may think will work often do not when they’re put into real circuits. So… let’s talk about why filters fail.

In this article, the author will identify two major types of single-conductor structure resonances and describe some case studies for both. He will then describe how design projects can quickly and easily be ‘de-risked’ from the possibilities of suffering either type of resonance by the use of low-cost field and circuit simulators and/or low-cost bench testing on physical ‘mock-ups’.

This article presents the results of experiments to measure the effectiveness of lossy material in reducing RF emissions from perforated air vents such as those commonly used on computer enclosures. The results show good performance compared to those with conventional metal vents.

Many real-time spectrum analyzer solution providers provide in-one-instrument add-ons which allow users to perform both the traditional swept-mode measurements in addition to real-time measurements.

The growth of connected products and the Internet of Things (IoT) presents many challenges and risks to manufacturers and developers.

This article describes a proposed addition to the IEC 61000-4-3 standard. This addition would allow detailed testing of a product while coordinating and documenting the frequency changes of the test.