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Expert Insights

Banana Skins – June 2024 (#452-453)

We are proud to carry on the tradition of sharing Banana Skins for the purpose of promoting education for EMI/EMC engineers.

Ham Radio? Is That Still A Thing?

"Ham radio still exists? With cell phones?" Well, let me tell you - this hobby is still thriving! Yeah, there's fun stuff like radiosport contests. But more importantly, it lets hams provide crucial emergency comms and advance radio tech when needed.

Military and Aerospace EMC: Portable Electronics Onboard Aircraft – Part 2

Committee SC-202, comprised of over 100 members from various industries, was formed to address safety concerns related to the use of transmitting portable electronic devices (T-PEDs) like those with cellular and wireless capabilities on an aircraft.

Product Insights: The 5-Hour Rule for Career Advancement and Overall Life Satisfaction

The 5-Hour Rule, a simple concept many successful people use, is a solution to making the time for honing and developing new skills.

Practical Engineering: Creepage Distance of an Optocoupler

This month's blog is pulled from the product safety playbook. It highlights a potential issue to avoid when considering an optocoupler's creepage distance when placed onto a printed circuit board (PCB).
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EMC Bench Notes: Interpreting Emissions Using a Near-Field Probe

Most engineers are familiar with near-field probes and that they are sensitive to E- or H-fields emanating from circuit boards, cables or enclosure seams. They are really the first order of business when evaluating a circuit board or system.

Image Theory: Radiation From Hertzian Dipole Above Ground Plane

This article presents the derivation of the radiated far fields from a Hertzian dipole antenna above the ground plane using image theory.

Voltage to Current Correlation for CDM Testing

It is now well known that testing for CDM ESD evaluation is becoming a bigger challenge. An alternate approach called capacitively coupled transmission line pulsing (CCTLP) offers advantages over standard field-induced CDM testing.

Using RF Monitoring Probes to Troubleshoot Transient Failures

In large systems, such as big cabinets housing numerous electronic components, employing the near-field probe method can be time-consuming and, depending on the voltage level, potentially unsafe (for instance, when dealing with high-voltage circuits requiring isolation). In such scenarios, an alternative approach is necessary.

Banana Skins – May 2024 (#445-451)

The Banana Skin columns were compiled by Keith Armstrong, of Cherry Clough Consultants Ltd, from items he found in various publications, and anecdotes and links sent in by the many fans of the column.
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