Expert Insights

The charged device model describes the electrostatic discharge (ESD) event that occurs when an integrated circuit (IC) is rapidly charged or discharged through a single pin to a metallic surface.

Whenever an electronic circuit is first energized, transients occur in current and voltage waveforms. These start-up transients can affect the electrical and thermal behavior of components and circuits with serious reliability, EMI, and random effects. Try to characterize how your circuits start and stop.

This article describes the voltage method of the conducted emissions measurements.

There always seem to be questions about hi-pot testing. Maybe I can present some of those questions and their answers.

Transmission Line Pulse testing is the default method for characterizing the behavior of devices under ESD circumstances.

Common mode currents are in the origin of many typical problems in EMI/EMC and RF electronics. The best way to understand those currents is to visualize them in your scope or spectrum analyzer.

This article discusses the topology and characteristics of a dc Line Impedance Stabilization Network (LISN), often referred to as an Artificial Network (AN).

How does safety work? That is, given a hazardous situation, how do we prevent injury from that situation?

A new symbol is being standardized for arc flash – and it’s an important step forward for safety.

If you are evaluating a design (i.e. power supply) from the EMI/EMC point of view, avoid replacing the real load with some kind of “equivalent resistor.” Differences can be really impressive.