Expert Insights

During the last four decades, damage to devices from electrical overstress (EOS) has confounded both IC suppliers and customers. The Industry Council on ESD Target Levels investigated numerous EOS root causes and established a white paper on the subject, JEP174 [1].

In our "On Your Mark" columns, we often discuss the importance of American National...

One car manufacturer found that the craze for CB radio caused more than a jamming of the airwaves.

A few basic system components are frequently used to mitigate or suppress electromagnetic interference (EMI) in devices. As engineers and technicians involved in compliance engineering, it is important to know what these components are, what they do, how they’re most effective, and when they’re ineffective.

This article explains how to use a Smith Chart to determine the input impedance to transmission line at a given distance from the source or the load.

In this article we discuss the MOS transistor in the role of ESD protection for high-voltage applications and take a look into a possible future of ESD protection devices for high-performance computing applications.

Spacecraft now and of the future are being controlled by EMC requirements of the past.

Before diving too deep into the nitty gritty of high frequency probing techniques, it’s imperative to understand a few basics, as described in the remaining portion of this article. The basics include probe calibration and null measurements and a description of the various types of voltage probes available, including their strengths and weaknesses.

High-power RF/microwave amplifiers are commonly used in EMC (Electromagnetic Compatibility) testing to meet radiated and conducted immunity requirements. These products can be a high overall cost, and selecting the correct models that meet your needs is imperative.

This is the second of the three articles devoted to the topic of a Smith Chart.