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S-Parameters Tutorial – Part II: EMC Measurements and Testing

This part II of the s-parameter tutorial presents several examples of the s-parameter use in EMC measurements and testing.

ESD Open Forum

Updates to Past CDM Open Forum Questions

Banana Skins – September 2018 (#92-105)

The Banana Skin columns were compiled by Keith Armstrong, of Cherry Clough Consultants Ltd, from items he found in various publications, and anecdotes and links sent in by the many fans of the column.

S-Parameters Tutorial – Part I: Fundamental Background

This s-parameters tutorial consists of two parts: Part I discusses the fundamental background needed to understand the concept of s-parameters; Part II explains the s-parameters use in EMC measurements and testing

S-parameters and EMI Filter Response

S-parameters are very useful to evaluate, understand, and optimize the response of your filters. If you are unfamiliar with this typical tool for RF engineers, this column is for you.
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EOS/ESD Association, Inc. Standards Development Process

How does a standard become the “Standard”?

Banana Skins – August 2018 (#79-91)

We hope you enjoy the column and look forward to continuing the tradition of sharing these valuable stories.

EMI Reduction by Spread-Spectrum Frequency Dithering

This article examines the spread-spectrum frequency dithering technique to reduce the EMI noise from a SMPS.

RBW and Overloading in EMI Debugging

Usually the confidence you have in your measurements is directly proportional to the cost of your instrument. Take care.

Charged Board Event (CBE)

Charged Board Event (CBE) is an electrostatic discharge (ESD) event that can occur on assembled printed circuit boards (PCB) and electromechanic assemblies.
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