Columns

S-parameters are very useful to evaluate, understand, and optimize the response of your filters. If you are unfamiliar with this typical tool for RF engineers, this column is for you.

How does a standard become the “Standard”?

We hope you enjoy the column and look forward to continuing the tradition of sharing these valuable stories.

This article examines the spread-spectrum frequency dithering technique to reduce the EMI noise from a SMPS.

Usually the confidence you have in your measurements is directly proportional to the cost of your instrument. Take care.

Charged Board Event (CBE) is an electrostatic discharge (ESD) event that can occur on assembled printed circuit boards (PCB) and electromechanic assemblies.

In this column, we’ll discuss the International Organization for Standardization’s recently published ISO 45001 standard, its parallels with risk communication on products and its implications for workplace safety.

We regularly receive requests from readers to publish stories about real EMI/EMC problems faced by real engineers.

This column explores the conducted immunity test known as a Bulk Current Injection (BCI) test, according to ISO 11452-4 specification.

A VSWR bridge and a magnetic near field probe (NFP) are very valuable tools to find resonances in RF and EMI/EMC applications as tuning, shielding, etc.