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GaN/SiC Transistors for Your Next Design: Fight or Flight?

This article offers some useful insights and guidelines on how to effectively design and test systems using wide band gap devices to optimize product performance and achieve EMC compliance.

(Re)Discovering the Lost Science of Near-Field Measurements, Part 4

This is the fourth and final article in our series commemorating 70 years since the advent of modern EMC testing.

(Re)Discovering the Lost Science of Near-Field Measurements, Part 3

This article is the third in a series commemorating 70 years since the advent of modern EMI testing. But this last article is itself divided into multiple parts, due to the topic’s complexity. Unlike the previous two articles, which mainly tracked evolution and explained issues, this series of installments argues that we started off correctly seventy years ago, but then took the wrong fork in the road in 1967.

Pre-Compliance EMI Testing

Pre-compliance testing saves time and costs by detecting potential problems early in the design process. The use of appropriate tools and techniques improves the chances of passing the full compliance test on the first try.

(Re)Discovering the Lost Science of Near-Field Measurements, Part 2

This article is the third in a series commemorating 70 years since the advent of modern EMI testing.
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In-Situ Radiated Emission Testing of Large Systems Installations

When it comes to in-situ radiated emission measurements, the combination of near- and far-field measurements is often the best approach.

(Re)Discovering the Lost Science of Near-Field Measurements – Part 1

This article is the third in a series commemorating 70 years since the advent of modern EMI testing. But this last article is itself divided into multiple parts, due to the topic’s complexity.

Seventy Years of Electromagnetic Interference Control in Planes, Trains, and Automobiles (and Ships and Spaceships, as well)

The first in a multi-part series of articles exploring the background of modern electromagnetic interference (EMI) requirements and test methods covers general topics.

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part I

The trend of progressively migrating both ESD and EMC immunity from the system/board to the component level is creating unprecedented challenges for the component ESD designer.

Top 10 ISO/IEC 17025:2017 Deficiencies Found in Electronics Testing Laboratories

Whether your organization is seeking ISO/IEC 17025 accreditation for the first time or renewing a current accreditation, there are a few frequently overlooked or misunderstood sections of the standard to pay attention to.
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