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This blog explains CDM ESD testing using the field-induced (FI) method, which is important for semiconductor manufacturers. It covers building a CDM-FI tester, waveform details and verification, and qualification nuances. 

Choosing an EMC test lab to work with is one of the most important decisions any electronics design engineer or product developer has to make.

Although understanding each capacitor type and behavior is daunting and difficult to memorize, it is prudent that every aspiring engineer and technician involved in design for EMC at least have a rudimentary understanding of what capacitor technologies are available.

To determine a shielding material’s potential absorption loss capability, you must first know the frequency or frequencies of concern and, second, what shield materials you have available.

To provide in-depth coverage of ESD testing methods, in this article, we look at another type of ESD testing based on the “Human Body Model” (HBM) method of ESD testing.

This article describes a loss-less impedance matching technique that does not require the use of discrete components but instead uses cables or printed circuit board (PCB) traces, i.e., distributed elements or transmission lines.

As a compliance engineering professional, you may encounter situations when you must consider how multiple and often conflicting requirements apply to your product and how to deal with them effectively.

This article addresses two very common questions involving two interrelated and specialized sub-fields within the realm of compliance engineering.

Should the reference (i.e., ground) plane be split into two separate sections and a ferrite bead installed between them to prevent unwanted radio frequency emissions? Let’s examine why this practice is not a good idea and should be avoided at all costs.

Discover the most important post-layout elements when selecting a SI/PI software simulation package.