hot topics in esd

Static control methods may be tested according to industry standards, but additional process risk assessment methods are needed to assure that the static control elements have been successful in mitigating the ESD risks.

The Industry 4.0 IoT platform automatically becomes a reliable and dependable venue for compliance verification, eliminating the traditional way of tedious predefined period manual checks.

Often (very) fast transients have been proven to trigger latch-up. This kind of latch-up is called transient induced latch-up, commonly known as “transient latch-up” (TLU).

ESD process control in factories where ESD-sensitive parts are being handled is the foundation for the manufacturing of high quality electronic products.

Circuit design reliability verification in Integrated Circuit (IC) design is extremely challenging.

The charged device model describes the electrostatic discharge (ESD) event that occurs when an integrated circuit (IC) is rapidly charged or discharged through a single pin to a metallic surface.