EOS/ESD Association

Charged Board Event (CBE) is an electrostatic discharge (ESD) event that can occur on assembled printed circuit boards (PCB) and electromechanic assemblies.

Often (very) fast transients have been proven to trigger latch-up. This kind of latch-up is called transient induced latch-up, commonly known as “transient latch-up” (TLU).

How is automated handling equipment treated under an S20.20 compliant ESD program?

Charged Device Model testing faces a reliability crisis as qualification levels drop below 250V. Legacy air spark methods become increasingly variable at lower voltages, while emerging relay-based alternatives offer consistent results without sacrificing correlation—a critical evolution for next-generation semiconductor qualification.

Charged device model (CDM) ESD is considered today to be the primary real world ESD model for representing ESD charging and rapid discharge and is the best representation of what can occur in automated handling equipment used in manufacturing and assembly of integrated circuits (IC) today.

Discover how engineers test electronic device resilience using Transmission Line Pulse testing, uncovering the critical science that protects our most sensitive technologies from catastrophic electrical failures.

There are several scenarios where integrated circuits (ICs) are mounted on printed circuit boards (PCBs) which might be charged-up and experience CDM-like events.

In ESD control programs, standard test methods for product qualification and periodic evaluation of wrist straps, garments, ionizers, worksurfaces, grounding, flooring, shoes, static dissipative planar materials, shielding bags, packaging, electrical soldering/desoldering hand tools, and flooring/footwear systems have been developed to ensure uniformity around the world.

Electrical overstress (EOS) accounts for most of the electrical failures of devices that occur...

The EOS/ESD Association is pleased to announce the recipient of the 2015 ESD Research...