EOS/ESD Association

Charged device model (CDM) ESD is considered today to be the primary real world ESD model for representing ESD charging and rapid discharge and is the best representation of what can occur in automated handling equipment used in manufacturing and assembly of integrated circuits (IC) today.

The charged device model describes the electrostatic discharge (ESD) event that occurs when an integrated circuit (IC) is rapidly charged or discharged through a single pin to a metallic surface.

Transmission Line Pulse testing is the default method for characterizing the behavior of devices under ESD circumstances.

There are several scenarios where integrated circuits (ICs) are mounted on printed circuit boards (PCBs) which might be charged-up and experience CDM-like events.

In ESD control programs, standard test methods for product qualification and periodic evaluation of wrist straps, garments, ionizers, worksurfaces, grounding, flooring, shoes, static dissipative planar materials, shielding bags, packaging, electrical soldering/desoldering hand tools, and flooring/footwear systems have been developed to ensure uniformity around the world.

Electrical overstress (EOS) accounts for most of the electrical failures of devices that occur...

The EOS/ESD Association is pleased to announce the recipient of the 2015 ESD Research...

Register now for the 37th Annual EOS/ESD Symposium September 27- October 2, 2015 being...

Register today for the 9th Annual International Electrostatic Workshop (IEW),  being held  May 3-7,...