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FDA Releases Digital Health Innovation Plan

In an effort to facilitate greater market access for new and advanced healthcare technologies,...

Date Set for the 2017 Ig Nobel Prizes

The 27th First Annual Ig Nobel Prizes will be announced at a special ceremony...

Next Generation Charged Device Model ESD Testing

The charged device model describes the electrostatic discharge (ESD) event that occurs when an integrated circuit (IC) is rapidly charged or discharged through a single pin to a metallic surface.

Hidden Start-up Events

Whenever an electronic circuit is first energized, transients occur in current and voltage waveforms. These start-up transients can affect the electrical and thermal behavior of components and circuits with serious reliability, EMI, and random effects. Try to characterize how your circuits start and stop.

Stanford Researchers Discover Energy-Rich Material in Supervolcanoes

Scientists have discovered that supervolcanoes are a remarkable new resource for lithium.
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Recent Standard Update: IEC 60730-2-14:2017 – Automatic Electrical Controls

The International Electrotechnical Commission (IEC) has released IEC TS 62462:2017

IEC Publishes IEC 60728-3:2017 Pre-Release Version for Active Wideband Equipment for Cable Networks

The International Electrotechnical Commission (IEC) has released IEC 60728-3:2017

ISO/IEC 29151:2017 Released for Information Technology – Security Techniques

The International Organization of Standardization (ISO) releases ISO/IEC 29151:2017
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11sep(sep 11)8:30 amFundamentals of Product Safety8:30 am(GMT-04:00) Event Type Academic Course

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