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Arc Flash Safety Labeling: Avoiding 9000°C Explosions

In this column we’ll explore the kinds of safety markings designed to warn against...

Myth vs. Reality: The Performance of Shields

The myth: The representation of shield performance (in dB) as applied to products will...

How Fast Does a Charge Decay?

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

GHS and Global Consistency

Today’s international marketplace demands consistency of labeling and symbols. In this article, we’ll explain...

The iNARTE Informer – July 2012

Technology transfer and moving of hardware from our New Bern, NC office to the...
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Signal Integrity Versus EMC During Printed Circuit Board Design

Engineers are beginning to face new challenges related to the design of printed circuit...

Polarization – For Better or Worse

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

From IEC to ISO

In this column, we'll explore how symbols migrate from IEC standards into ISO standards...

Myth vs. Reality: Common-Mode Field Transfer – Coupling Between Circuit Boards and Conductive Chassis Structures

This document discusses the myth that digital circuit boards can be isolated from conductive chassis structures, explaining the reality that they are always coupled through distributed capacitance and transmission line effects.

The iNARTE Informer – June 2012

The process of merging iNARTE into the RABQSA International organization is now well under...
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