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Expert Insights

Hidden Start-up Events

Whenever an electronic circuit is first energized, transients occur in current and voltage waveforms. These start-up transients can affect the electrical and thermal behavior of components and circuits with serious reliability, EMI, and random effects. Try to characterize how your circuits start and stop.

Conducted Emissions Measurements: Voltage Method

This article describes the voltage method of the conducted emissions measurements.

The Dielectric Withstand (Hi-pot) Test

There always seem to be questions about hi-pot testing. Maybe I can present some of those questions and their answers.

Transmission Line Pulse Testing: The Indispensable Tool for ESD Characterization of Devices, Circuits and Systems

Transmission Line Pulse testing is the default method for characterizing the behavior of devices under ESD circumstances.

CM Versus DM Currents

Common mode currents are in the origin of many typical problems in EMI/EMC and RF electronics. The best way to understand those currents is to visualize them in your scope or spectrum analyzer.
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Topology and Characterization of a DC Line Impedance Stabilization Network

This article discusses the topology and characteristics of a dc Line Impedance Stabilization Network (LISN), often referred to as an Artificial Network (AN).

Models for Protection Against Injury

How does safety work? That is, given a hazardous situation, how do we prevent injury from that situation?

A New Symbol For Added Safety: Arc Flash

A new symbol is being standardized for arc flash – and it’s an important step forward for safety.

Test EMI Profile of Your Systems with Real Loads

If you are evaluating a design (i.e. power supply) from the EMI/EMC point of view, avoid replacing the real load with some kind of “equivalent resistor.” Differences can be really impressive.

Human-Body Model and Electrostatic Discharge (ESD) Tests

Consider a spherical capacitor consisting of two concentric, conducive spheres separated by a dielectric.
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