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Transmission Line Reflections at the RL and RC Loads

This article discusses the reflections on a transmission line terminated with either an RL or an RC load.

Two Pin HBM Testing: A New Option?

Human Body Model (HBM) is the original ESD test method for semiconductor devices and...

Banana Skins – January 2021 (#307-315)

Typically, regular voltage quality spot checks are made throughout a local distribution system with additional measurements taken when a customer asks; is there a voltage problem?

Important Considerations When Installing, Tearing Down, and Moving an EMC Chamber

You’re an expert at EMC testing but, when it comes to installing, tearing down, and moving an EMC chamber, you may not have a clear understanding of all of the non-engineering tasks that go along with such an important event.

PCB Return-Current Distribution in the Stripline Configurations

This article discusses the current distribution for the stripline configurations.
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Factors Involving ESD Protection Cell Design Selections

How is the proper ESD Protection Cell chosen for a particular design application?

Banana Skins – December 2020 (#302-306)

302.  Early colour TV interference from early police radio handset, warns criminals About the time...

An Alternative Approach to Specifying an EMI Filter

There has to be a better way of specifying EMI filter performance – one that shows a filter’s effectiveness in real-life situations. It turns out there is a better alternative test method that fulfills this need. This method is the insertion loss test method for non-50Ω systems, located in Annex C of the second edition of EN 55017 (a.k.a. CISPR 17).

PCB Return-Current Distribution in a Microstrip Line

This article discusses the distribution of a PCB return current underneath top trace for the microstrip configuration. Next month’s article will discuss the distribution for the stripline configurations.

Those Semiconductor Datasheet Absolute Maximum Ratings (AMR) are Critical

The purpose of AMR is to warn “customers” who use the semiconductor product that there are physical limits that must not be violated if reliability is to be preserved.
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