Columns

We are proud to carry on the tradition of sharing Banana Skins for the purpose of promoting education for EMI/EMC engineers.

This part II of the s-parameter tutorial presents several examples of the s-parameter use in EMC measurements and testing.

Updates to Past CDM Open Forum Questions

The Banana Skin columns were compiled by Keith Armstrong, of Cherry Clough Consultants Ltd, from items he found in various publications, and anecdotes and links sent in by the many fans of the column.

This s-parameters tutorial consists of two parts: Part I discusses the fundamental background needed to understand the concept of s-parameters; Part II explains the s-parameters use in EMC measurements and testing

S-parameters are very useful to evaluate, understand, and optimize the response of your filters. If you are unfamiliar with this typical tool for RF engineers, this column is for you.

How does a standard become the “Standard”?

We hope you enjoy the column and look forward to continuing the tradition of sharing these valuable stories.

This article examines the spread-spectrum frequency dithering technique to reduce the EMI noise from a SMPS.

Usually the confidence you have in your measurements is directly proportional to the cost of your instrument. Take care.