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Columns

ISO 45001: What It Means for Safety and Risk Communication

In this column, we’ll discuss the International Organization for Standardization’s recently published ISO 45001 standard, its parallels with risk communication on products and its implications for workplace safety.

Banana Skins – July 2018 (#68-78)

We regularly receive requests from readers to publish stories about real EMI/EMC problems faced by real engineers.

Bulk Current Injection (BCI) – Substitution Method and Closed-Loop Method with Power Limitation

This column explores the conducted immunity test known as a Bulk Current Injection (BCI) test, according to ISO 11452-4 specification.

Evaluate Resonances with Near Field Probes and VSWR Bridges

A VSWR bridge and a magnetic near field probe (NFP) are very valuable tools to find resonances in RF and EMI/EMC applications as tuning, shielding, etc.

Product Qualification in an ESD Control Program

Section 7.3 in ANSI/ESD S20.20–2014 includes a requirement for a product qualification plan.
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Banana Skins – June 2018 (#62-67)

We are pleased to bring you Banana Skins, a new monthly column in In Compliance, and a 20-year tradition that began in the pages of the EMC Journal. We hope you enjoy the column and look forward to continuing the tradition of sharing these valuable stories.

SMPS Input Filter Design: Negative Resistance Approach

This article discusses a practical approach to designing an input filter to the switch-mode power supply (SMPS).

ESD Measurement Methods Affected by Manufacturing Changes

Static control methods may be tested according to industry standards, but additional process risk assessment methods are needed to assure that the static control elements have been successful in mitigating the ESD risks.

Banana Skins – May 2018 (#54-61)

We are proud to carry on the tradition of sharing Banana Skins for the purpose of promoting education for EMI/EMC engineers.

Near-Field Shield Effectiveness Evaluation Using H-Field Probe

We compare the shielding effectiveness of various solid metallic shields by direct H-field measurements in the near field of the source.
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