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Electronic Engineering Terms & Definitions

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  • Term
    Definition
  • IEC 61000-4-7:2002+A1:2008 applies to instrumentation intended for measuring spectral components in the frequency range up to 9 kHz which are superimposed on the fundamental of the power supply systems at 50 Hz and 60 Hz. For practical considerations, this standard distinguishes between(...)
  • IEC 61000-4-8:2009 relates to the immunity requirements of equipment, only under operational conditions, to magnetic disturbances at power frequencies 50 Hz and 60 Hz related to: residential and commercial locations; industrial installations and power plants; medium voltage and high voltage(...)
  • IEC 61000-4-9 relates to the immunity requirements of equipment, only under operational conditions, to pulse magnetic disturbances mainly related to: - industrial installations and power plants - medium voltage and high voltage sub-stations.
  • IEC 61000-4-10 relates to the immunity requirements of equipment, only under operational conditions, to damped oscillatory magnetic disturbances related to medium voltage and high voltage sub-stations
  • This part of IEC 61000 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic(...)
  • This part of IEC 61000 relates to the immunity requirements and test methods for electrical and electronic equipment, under operational conditions, to non-repetitive damped oscillatory transients (ring waves) occurring in low-voltage power, control and signal lines supplied by public and(...)
  • IEC 61000-4-13:2002+A1:2009 defines the immunity test methods and range of recommended basic test levels for electrical and electronic equipment with rated current up to 16 A per phase at disturbance frequencies up to and including 2 kHz (for 50 Hz mains) and 2,4 kHz (for 60 Hz mains) for(...)
  • IEC 61000-4-14:1999+A1:2001+A2:2009 applies to electrical and/or electronic equipment that have a rated input current up to 16 A per phase. Aims to establish a reference for evaluating the immunity of electric and/or electronic equipment when subjected to positive and negative low amplitude(...)
  • IEC 61000-4-15:2010 gives a functional and design specification for flicker measuring apparatus intended to indicate the correct flicker perception level for all practical voltage fluctuation waveforms. Information is presented to enable such an instrument to be constructed. A method is given(...)
  • IEC 61000-4-16:1998+A1:2001+A2:2009 Establishes a common and reproducible basis for testing electrical and electronic equipment with the application of common mode disturbances to power supply, control, signal and communication ports. This standard defines test voltage and current waveform,(...)
  • IEC 61000-4-17 defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines test voltage(...)
  • EC 61000-4-18:2006+A1:2010 relates to the immunity requirements and test methods for electrical and electronic equipment, under operational conditions, with regard to: repetitive damped oscillatory waves occurring mainly in power, control and signal cables installed in high voltage and medium(...)
  • IEC 61000-4-19:2014 relates to the immunity requirements and test methods for electrical and electronic equipment to conducted, differential mode disturbances and signalling in the range 2 kHz up to 150 kHz at a.c. power ports.
  • IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures(...)
  • IEC 61000-4-21:2011 considers tests of immunity and intentional or unintentional emissions for electric and/or electronic equipment and tests of screening effectiveness in reverberation chambers. It establishes the required test procedures for performing such tests. Only radiated phenomena are(...)
  • IEC 61000-4-22:2010 considers immunity tests and emission measurements for electric and/or electronic equipment. Only radiated phenomena are considered. It establishes the required test procedures for using fully anechoic rooms for performing radiated immunity testing and radiated emission(...)
  • IEC 61000-4-23 provides the basic reasons behind HEMP testing and gives a brief description of the most important concepts for shielding element testing. For each test, the following basic information is provided: - theoretical foundation of the test (the test concept); - test set-up; -(...)
  • IEC 61000-4-24 deals with methods for testing protective devices for HEMP conducted disturbance. It primarily covers testing of voltage breakdown and voltage-limiting characteristics but also methods to measure the residual voltage under HEMP conditions for the case of very fast changes of(...)
  • IEC 61000-4-25:2001+A1:2012 describe immunity test levels and related test methods for electrical and electronic equipment and systems exposed to high-altitude electromagnetic pulse (HEMP) environments. Specifications for test equipment and instrumentation test set-up, test procedures,(...)
  • IEC 61000-4-27:2000+A1:2009 considers immunity tests for electric and/or electronic equipment (apparatus and system) in its electromagnetic environment. Only conducted phenomena are considered, including immunity tests for equipment connected to public and industrial networks. Establishes a(...)

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