Member Directory

Gregory Tait is currently an electrical engineer with the Electromagnetic and Sensor Systems Department at the Naval Surface Warfare Center Dahlgren Division in Dahlgren, VA. He earned the PhD degree in Electrical Engineering from The Johns Hopkins University. Areas of current interest include stochastic electromagnetics in complex cavities and wireless signal propagation in coupled reflective spaces.

Joe Tannehill has been working in the EMC field for over 27 years, starting with Intergraph Corp. in Huntsville, Alabama testing and designing graphics workstations and associated computing components. From there he worked at Gateway 2000 and at Dell designing laptop, desktop and enterprise systems. In 2005, Joe took a detour to the Department of Defense world working for Raytheon in Sudbury, Massachusetts where he was a design consultant with MIT’s Draper Labs. Longing for the heat of Texas he moved back to Austin to work with Motion Computing and then at ETS-Lindgren in his present position as an EMC engineer managing and supporting TILE! EMC test software, including organization of the annual TILE! Users Group meeting. This year’s meeting will be held on August 17 in Long Beach, California during the IEEE EMC Symposium. Joe is the inventor of two EMC related patents.

Sam Theabo is a staff Quality Engineer and corporate ESD Coordinator at Plexus Global Headquarters in Neenah, Wisconsin, with 24 years of career service. Previously, Sam was a Quality Assurance Engineer at AT&T – Western Electric in Lisle, IL, supporting the manufacture of ESS telephone switching systems. Theabo is ASQ-CQA and CQT certified.

David W. P. Thomas MIET SMIEEE CEng received the B.Sc. degree in Physics from Imperial College of Science and Technology, the M.Phil. degree in Space Physics from Sheffield University, and the Ph.D. degree in Electrical Engineering from Nottingham University, in 1981, 1987 and 1990, respectively. In 1990 he joined the Department of Electrical and Electronic Engineering at the University of Nottingham as a Lecturer where he is now an Associate Professor and Reader. His research interests are in electromagnetic compatibility, electromagnetic simulation, power system transients and power system protection,. He is a member of CIGRE and convenor for Joint Working Group 4.207 “EMC of communication circuits, low voltage systems and metallic structures in the vicinity of power systems”. He is also Secretary to the IEEE EMC Technical committee T7 on Low Frequency EMC.

Wayne Tustin founded the Equipment Reliability Institute, Santa Barbara, California, in 1996. This specialized engineering school offers 3-day introductory courses about random vibration and shock testing. Concurrently, he is developing an iBook tablet version of his 2005 text ISBN 0-9741466-0-9.

Mr. Viel is the Chief Engineer, EMI/E3 for Element U.S. Space & Defense and has been with the organization for 26 years. He has over 30 years of equipment and system level EMI/E³ test and analysis experience in the defense and aerospace industries.

Mr. Viel is a subject matter expert in the US DoD electromagnetic interference & control requirements for electronic & electrical equipment and systems and provides technical engineering guidance and support to product manufacturers worldwide. Services include EMI/E3 training courses, equipment and system level EMI/E3 design assessments, support of complex EMI/E3 product qualification programs, EMI/E3 testing of high-power equipment and systems, and mobilized/portable EMI/E3 test services. Jeff also specializes in several technical service areas including RADHAZ (HERO, HERP, HERF), EMP, ESD, HPM, EMV, EMI Platform Surveys, Shielding Effectiveness (SE), Lightning effects, external electromagnetic environments (EME), and power quality testing for ships, subs, aircraft, space systems, and land vehicles. Throughout his career, Jeff has supported countless EMI/E3 qualification programs for a wide variety of equipment and systems deployed across every major US DoD platform type (Ship, Submarine, Land, Space, and Air).

Jeff Holds B.S. and M.S. degrees in Electrical Engineering from Northeastern University and is a supporting member of several national and international standards committees including the SC135 working group for RTCA DO160 (Environmental Conditions and Test Procedures for Airborne Equipment), SC238 working group for Counter UAS systems, SAE Technical Committee AE-4 (Electromagnetic Compatibility), and the Space ISAC SPD 5 Task Force. He has also published several EMI/EMC/E³ related technical papers over the last two decades.

Mike Violette is Director at-large with the EMC Society and supports the EMCS to IEEE’s IoT initiatives. Mike can be reached at mikev@wll.com.

Martin Vogel received his M.S. degree in Physics from Leiden University in 1985 and his PhD in Electromagnetics from Delft University of Technology, both in the Netherlands. From 1985 through 1996 he worked for TNO Defense and Security, a Dutch defense contractor, on topics involving radar cross section, antennas and propagation. In 1996 he had a one-year assignment at Kirtland Air Force Base in New Mexico. From 1996 until 2011 he worked for Ansoft (Ansys) as a senior application engineer and in several other roles. Currently he is with EMSS (USA) as the principal application engineer.

Nick Wainwright has been involved with EMC all his working life, starting as an EMC test engineer in the telecommunications industry before moving into commercial testing. He joined York Electronics Centre, the predecessor to York EMC Services, in 1990 as an EMC Test Engineer and worked his way up the organization until this year he was given the task of running the 40 strong company as Chief Operating Officer. Nick takes a very hands-on approach to the roles he undertakes and has specified and designed EMC test facilities and implemented quality systems within laboratories to enable them to achieve accreditation to ISO17025. Nick is a regular speaker at EMC conferences, courses and workshops on subjects ranging from CE Marking and standards to testing, ISO17025 and measurement uncertainty.