September 2017

Current probes are transformers that translate magnetic fields into measurable voltages. This comprehensive guide explains the physics behind current probe measurements, from Faraday's law to transfer impedance calculations, with real EMC test results in all three detection modes.

High-current grounding impedance tests have been specified in safety standards for many years. There are two, independent sources for these tests.

Charged Device Model testing faces a reliability crisis as qualification levels drop below 250V. Legacy air spark methods become increasingly variable at lower voltages, while emerging relay-based alternatives offer consistent results without sacrificing correlation—a critical evolution for next-generation semiconductor qualification.

Start‑up transients can hide major EMI and reliability problems. By capturing inrush current spikes and high‑frequency events with high‑bandwidth scopes and probes, engineers can uncover failures, resets, and random behavior caused by fast di/dt during power‑up—and design effective fixes.

Learn about the design of a stand-alone (off- chip) protection device which meets all requirements.

Charged device model (CDM) ESD is considered today to be the primary real world ESD model for representing ESD charging and rapid discharge and is the best representation of what can occur in automated handling equipment used in manufacturing and assembly of integrated circuits (IC) today.

Each component in an ESD protected area (EPA) plays a vital part in the fight against electrostatic discharge (ESD). If just one component is not performing correctly, you could harm your ESD sensitive devices potentially costing your company a lot of money.