Learn about the design of a stand-alone (off- chip) protection device which meets all requirements.
Charged device model (CDM) ESD is considered today to be the primary real world ESD model for representing ESD charging and rapid discharge and is the best representation of what can occur in automated handling equipment used in manufacturing and assembly of integrated circuits (IC) today.
Each component in an ESD protected area (EPA) plays a vital part in the fight against electrostatic discharge (ESD). If just one component is not performing correctly, you could harm your ESD sensitive devices potentially costing your company a lot of money.
This article focuses on the current probes used in EMC measurements and testing.
High-current grounding impedance tests have been specified in safety standards for many years. There are two, independent sources for these tests.
The charged device model describes the electrostatic discharge (ESD) event that occurs when an integrated circuit (IC) is rapidly charged or discharged through a single pin to a metallic surface.
Whenever an electronic circuit is first energized, transients occur in current and voltage waveforms. These start-up transients can affect the electrical and thermal behavior of components and circuits with serious reliability, EMI, and random effects. Try to characterize how your circuits start and stop.