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Past Columns

Voltage and Field Strength – Part 2: Conductors

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

Measuring Breakdown Voltage with an ESD Simulator

Measuring high voltage breakdown has many uses including tracking down the cause of equipment...

The iNARTE Informer – August 2012

It is now time to introduce the officers and staff of RABQSA International who...

The Performance of Shields

The myth: The representation of shield performance (in dB) as applied to products will...

How Fast Does a Charge Decay?

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...
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The iNARTE Informer – July 2012

Technology transfer and moving of hardware from our New Bern, NC office to the...

Signal Integrity Versus EMC During Printed Circuit Board Design

Engineers are beginning to face new challenges related to the design of printed circuit...

Polarization – For Better or Worse

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

Common-mode Field Transfer: Coupling Between Circuit Boards and Conductive Chassis Structures

The myth: Digital (high frequency spectra) circuit boards can be isolated from chassis structures. The...

The iNARTE Informer – June 2012

The process of merging iNARTE into the RABQSA International organization is now well under...
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