Hot Topics in ESD

Section 7.3 in ANSI/ESD S20.20–2014 includes a requirement for a product qualification plan.

Static control methods may be tested according to industry standards, but additional process risk assessment methods are needed to assure that the static control elements have been successful in mitigating the ESD risks.

ANSI/ESD STM 11.11-2015 was developed to fulfil a need to measure static dissipative planar materials not provided for by existing ASTM resistivity measurement methods.

The Industry 4.0 IoT platform automatically becomes a reliable and dependable venue for compliance verification, eliminating the traditional way of tedious predefined period manual checks.

Often (very) fast transients have been proven to trigger latch-up. This kind of latch-up is called transient induced latch-up, commonly known as “transient latch-up” (TLU).

ESD process control in factories where ESD-sensitive parts are being handled is the foundation for the manufacturing of high quality electronic products.

How is automated handling equipment treated under an S20.20 compliant ESD program?

Circuit design reliability verification in Integrated Circuit (IC) design is extremely challenging.

How can we provide a quantitative measure of ESD robustness but control the rising test times while preventing major overstress and wear out from thousands of ESD strikes per IC?

The charged device model describes the electrostatic discharge (ESD) event that occurs when an integrated circuit (IC) is rapidly charged or discharged through a single pin to a metallic surface.