Magazine

This article discusses the current distribution for the stripline configurations.

How is the proper ESD Protection Cell chosen for a particular design application?

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There has to be a better way of specifying EMI filter performance – one that shows a filter’s effectiveness in real-life situations. It turns out there is a better alternative test method that fulfills this need. This method is the insertion loss test method for non-50Ω systems, located in Annex C of the second edition of EN 55017 (a.k.a. CISPR 17).

This article discusses the distribution of a PCB return current underneath top trace for the microstrip configuration. Next month’s article will discuss the distribution for the stripline configurations.

The purpose of AMR is to warn “customers” who use the semiconductor product that there are physical limits that must not be violated if reliability is to be preserved.

We are proud to carry on the tradition of sharing Banana Skins for the purpose of promoting education for EMI/EMC engineers.

The safety performance specifications of RF absorbers are just as important as the other attributes of RF absorber performance.

This article discusses the common-mode and differential-mode radiation from cables and presents the measurement results from the SMPS connecting wires.

This article reviews some of the ESD protection design challenges when designing in a FinFET technology and give an outlook on the successors of FinFET.