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The 2025 Annual Reference Guide

Our 2025 Reference Guide delivers expert knowledge when you need it most—from EMC testing to wireless coexistence. As technology evolves, we've enhanced this edition with practical solutions and expanded resources to support your critical compliance work.

Beyond Compliance: Engineering Success

We’ve compiled a list of best practices that we believe embody the very essence of a thriving compliance engineering career.

Letter from the Editor: The 2024 Annual Reference Guide

Here at In Compliance Magazine, an important part of our mission is to help our readers build their knowledge and understanding of the increasingly complex regulatory compliance landscape.

Impact of Decoupling Capacitors and Trace Length on Radiated Emissions in a CMOS Inverter Circuit

This article evaluates the impact of decoupling capacitors and trace length on radiated emissions.

Difference Amplifier: Common Mode and Differential Mode Voltages

This column describes the operation of an ideal difference amplifier. It is shown that an ideal difference amplifier (with no resistance mismatches) eliminates the common mode portion of the input voltage and amplifies only the differential mode portion of the input voltage.
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Challenges of CDM Modeling for High-Speed Interface Devices

The behavior of ultra-high-speed interfaces is complex, involving fast-rise time waveforms and on-die transient phenomena that cause device failure at lower CDM levels.

Using a Near-Field Probe to Troubleshoot Transient Failures

Ever wonder why equipment mysteriously fails in the field? This case study reveals how one manufacturer solved frustrating intermittent timer resets in an industrial kitchen—using clever EMI troubleshooting techniques with an EFT generator and near-field probe. Learn their practical fix that ended costly service calls.

Banana Skins – February 2024 (#437-444)

A manufacturer of electrical test equipment took an order worth several million dollars for new product to be used worldwide to help service the vehicles manufactured by a major multinational.

Impact of a Decoupling Capacitor and Trace Length on Signal Integrity in a CMOS Inverter Circuit

This article describes a laboratory experiment that shows the impact of the decoupling capacitors and a PCB trace length on the signal integrity in a CMOS inverter circuit.

Integrating Embedded ESD Detection, Part 3

This column outlines the steps to consider when embedding ESD detection capabilities into your system and overall design flow.
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