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Abatement of Static Electricity – Part I: Conductors

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

Neutralization of Static Charges by Air Ions – Part II: Experimental Results

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

Neutralization of Static Charges by Air Ions – Part I: Theory

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

Acupuncture and Atmospheric Ions

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

Destroying Electronic Components from Across the Room With ESD

(Today’s sensitive components are really sensitive!) Electronic components are getting smaller and more sensitive every...

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Breakdown

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering...

Emerging Scanning Technologies for EMC

Electronic products are designed and tested to a variety of EMC requirements. Although specific requirements and test methods can vary by industry, ESD, transient immunity, RF immunity and RF emissions are evaluated for most products – certainly for all products that require a CE Mark.

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