Resources

Choosing an EMC test lab to work with is one of the most important decisions any electronics design engineer or product developer has to make.

This is the third article of a three-article series devoted to the correlation between the insertion loss and input impedance of passive EMC filters.

This column focuses on the practical aspects of implementing embedded ESD detection. We’ll provide a step-by-step guide, discuss validation and testing methodologies, present case studies, and delve into future trends and innovations in the field.

Occasionally, we are asked to help develop shielding effective for near-field low-frequency (LF) magnetic fields, perhaps in a situation where some regulatory agency has imposed limits on LF magnetic field emissions of our product, and we are forced to comply.

This is the second of a three-article series devoted to the correlation between the insertion loss and input impedance of passive EMC filters. This article focuses on π and T filters.

ESD “event detectors” have been used for years in factory environments to identify and remediate ESD discharges during manufacturing. Now design engineers are embedding system-level and on-chip ESD detection technologies into their systems to analyze and recover from both factory and field ESD events.

Conducted emission tests can provide reasonably accurate results and also serve as a reliable indicator of radiated emissions, as some of these emissions propagate through cable wiring.

Although understanding each capacitor type and behavior is daunting and difficult to memorize, it is prudent that every aspiring engineer and technician involved in design for EMC at least have a rudimentary understanding of what capacitor technologies are available.

This is the first article of a three-article series devoted to the correlation between the insertion loss and input impedance of passive EMC filters.

Simple star-tree networks, as shown here for USB2, should have wide applicability for cables carrying fast signals.