Resources

High-current grounding impedance tests have been specified in safety standards for many years. There are two, independent sources for these tests.

Charged Device Model testing faces a reliability crisis as qualification levels drop below 250V. Legacy air spark methods become increasingly variable at lower voltages, while emerging relay-based alternatives offer consistent results without sacrificing correlation—a critical evolution for next-generation semiconductor qualification.

Whenever an electronic circuit is first energized, transients occur in current and voltage waveforms. These start-up transients can affect the electrical and thermal behavior of components and circuits with serious reliability, EMI, and random effects. Try to characterize how your circuits start and stop.

This article describes the voltage method of the conducted emissions measurements.

There always seem to be questions about hi-pot testing. Maybe I can present some of those questions and their answers.

Discover how engineers test electronic device resilience using Transmission Line Pulse testing, uncovering the critical science that protects our most sensitive technologies from catastrophic electrical failures.

Love the technology, but tired of cubicle life? Maybe you should consider becoming a sales engineer.

Common mode currents are in the origin of many typical problems in EMI/EMC and RF electronics. The best way to understand those currents is to visualize them in your scope or spectrum analyzer.

This article discusses the topology and characteristics of a dc Line Impedance Stabilization Network (LISN), often referred to as an Artificial Network (AN).

How does safety work? That is, given a hazardous situation, how do we prevent injury from that situation?