
Sergej Bub, the lead author of this paper, is a System Level ESD expert at Nexperia Germany GmbH in Hamburg. He graduated with a M.Sc. in electrical engineering at the Technical University of Hamburg specializing in nanoelectronics and microsystems technology. He is working at Nexperia in the development department in the area of ESD protection and filtering, focusing on modeling and simulation of high-speed application systems and discrete ESD protection components, covering automotive, mobile, and computing areas, as well as development and optimization of ESD protection devices for such applications. Sergej can be reached at sergej.bub@nexperia.com.
Sergej Bub, the lead author of this paper, is a System Level ESD expert at Nexperia Germany GmbH in Hamburg. He graduated with a M.Sc. in electrical engineering at the Technical University of Hamburg specializing in nanoelectronics and microsystems technology. He is working at Nexperia in the development department in the area of ESD protection and filtering, focusing on modeling and simulation of high-speed application systems and discrete ESD protection components, covering automotive, mobile, and computing areas, as well as development and optimization of ESD protection devices for such applications. Sergej can be reached at sergej.bub@nexperia.com.