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Winners Announced for the CST University Publication Award

The CST University Publication Award is an annual grant awarded to university institutes and researchers for work related to 3D field simulation applications. The winners are awarded extensions and upgrades to their CST STUDIO SUITE® installations to recognize the importance of their work and to promote further research.

Submissions were evaluated on a number of criteria including originality of application and theory, clarity of presentation and the skillful usage of CST software. There are three conditions of participation: papers must be authored or co-authored by university researchers, they must have been published either in scientific journals or conference proceedings and the numerical results must be entirely or in part obtained through simulations using CST software products.

More information about the program and their year’s winners can be found at www.cst.com/content/company/uniprogram.aspx.

- Partner Content -

Precision Control in Semiconductor Wafer Lapping

Vitrek’s application note details how MTI’s Accumeasure™ uses non-contact, push-pull capacitance probes for real-time, sub-micron thickness monitoring during semiconductor wafer lapping—even in electrically noisy, ungrounded environments. Automated alerts prevent over-thinning, improving yield consistency, precision, and process safety.

 

 

 

 

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