Interoperability Testing for Connected Products and the Internet of Things
The growth of connected products and the Internet of Things (IoT) presents many challenges and risks to manufacturers and developers.
Closed Loop Radiated Immunity Testing
This article describes a proposed addition to the IEC 61000-4-3 standard. This addition would allow detailed testing of a product while coordinating and documenting the frequency changes of the test.
Antenna Selection for IEC 61000-4-3
With so many different antenna options on the market, it is not always easy to understand what will work best for your application.
Factors in Selecting Programmable AC Power Sources
Many electrical testing applications require a stable power source. Instead of having a custom design for each application, the programmable power sup... Read More...
Gun Test of a USB3 Host Controller Board
System level tests on a USB3 controller with on-board protection were found to yield irreproducible failure levels. A root cause analysis was performed using a combination of gun tests, TLP tests, and SEED simulation. It was found that an inductive current distribution between protection and SoC may explain the actual failure levels. Solutions are presented for effective on-board protection of USB3 controller boards.
New Methods of Air Ionizer Performance Testing
This article defines ionization qualification and periodic verification test procedures for ionizers which are not addressed in STM3.1 or SP3.3, including air-assist bar ionizers, soft x-ray ionizers, an alternative method of room ionization, and non-airflow alpha ionizers.
Reproducibility of CISPR 25 ALSE Test Method
Accredited test laboratories, complying with the requirements of ISO/IEC 17025 have to evaluate measurement uncertainty.
Proper Probe Practice is Paramount in Practical Systems
If someone were to ask you what one singular device is most synonymous with testing, or even electrical engineering, the overwhelming response would most likely be the oscilloscope probe.
How To Correctly Perform System Level ESD Testing of High-Speed Interface Boards
It is no trivial matter to properly interpret system level test results on high-speed boards. Board manufacturers (OEMs) assess the ESD robustness of their system by means of gun testing, not always in accordance with the IEC standard.
Verifying the Effect of ElectroMagnetic Noise on an In-Vehicle Ethernet Network
This article describes how the principles of laboratory testing of electrical noise impairment can be followed in the automotive sector to dramatically reduce the manufacturer’s development time and effort.