System level tests on a USB3 controller with on-board protection were found to yield irreproducible failure levels. A root cause analysis was performed using a combination of gun tests, TLP tests, and SEED simulation. It was found that an inductive current distribution between protection and SoC may explain the actual failure levels. Solutions are presented for effective on-board protection of USB3 controller boards.
This article defines ionization qualification and periodic verification test procedures for ionizers which are not addressed in STM3.1 or SP3.3, including air-assist bar ionizers, soft x-ray ionizers, an alternative method of room ionization, and non-airflow alpha ionizers.
It is no trivial matter to properly interpret system level test results on high-speed boards. Board manufacturers (OEMs) assess the ESD robustness of their system by means of gun testing, not always in accordance with the IEC standard.
This article describes how the principles of laboratory testing of electrical noise impairment can be followed in the automotive sector to dramatically reduce the manufacturer’s development time and effort.