Testing

Pre-compliance testing saves time and costs by detecting potential problems early in the design process. The use of appropriate tools and techniques improves the chances of passing the full compliance test on the first try.

This article is the third in a series commemorating 70 years since the advent of modern EMI testing.

When it comes to conducting electromagnetic compatibility (EMC) testing, TEM (Transverse ElectroMagnetic) cells and GTEM (GigaHertz Transverse ElectroMagnetic) cells are widely used for their ability to generate controlled and repeatable test environments.

When it comes to in-situ radiated emission measurements, the combination of near- and far-field measurements is often the best approach.

This article is the third in a series commemorating 70 years since the advent of modern EMI testing. But this last article is itself divided into multiple parts, due to the topic’s complexity.

The second in a series of articles commemorating the 70th anniversary of the inception of modern EMI requirements and test methods

The first in a multi-part series of articles exploring the background of modern electromagnetic interference (EMI) requirements and test methods covers general topics.

The trend of progressively migrating both ESD and EMC immunity from the system/board to the component level is creating unprecedented challenges for the component ESD designer.

Manufacturers need to understand their legal responsibilities when analyzing post-sale incidents, injuries, and lawsuits so they can argue that they met their statutory reporting responsibilities.

As long as integrated circuits migrate to new technologies and advances are made in packaging more integrated circuit dies into a single package, the CDM challenge is going to get harder.