Testing

Learn from best practices within the industry, pre-testing considerations, troubleshooting tips, lessons-learned, and problem solving recommendations.

The REACH Era
The regulation referred to as REACH (Registration, Evaluation and Authorization of Chemicals), came into effect in European Union Member States in June of 2007. The intent of REACH is to regulate chemicals that can cause cancer and other diseases.

REACH applies to thousands of chemicals (substances) that are used or present in electrical equipment. REACH also applies to mixtures or solutions of substances (preparations), and end products (articles). Substances of Very High Concern (SVHCs), are the most hazardous and harmful substances and are highly regulated. Products containing SVHCs may not receive authorization if a safer alternative exists.

REACH affects all organizations that export, manufacture, or use chemicals. Early planning and good communications are urgently needed to avoid disruptions in the supply chain. Parts and equipment manufacturers will be affected by unexpected withdrawal of substances from their suppliers due to REACH.

Leveraging Safety and EMC Skills in Energy Regulatory Compliance

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Ensuring Connectivity During Product Safety Testing

Two common product safety tests seen in production are the dielectric strength test (commonly referred to as hipot) and a ground test. The hipot test stresses the insulation of a product, while the ground test ensures proper ground connections within the product. The two most common ground tests are ground bond and ground continuity. This article will discuss these two common tests, as well as safeguards to ensure proper testing.

Independent Labs Provide Value-Added Services

Manufacturers and distributors of electronic and electrical devices are required to meet various Product Safety standards established by the United States, Canada, European Union, and various global agencies. Today, manufacturers have multiple options for testing their products to various North American Standards through Nationally Recognized Testing Laboratories (NRTLs) and independent value-added laboratories that have approvals for NRTL testing under a variety of programs. Good independent labs must be assessed to ISO 17025 for testing laboratories, similar to those requirements found under ISO 9000 requirements for manufacturers.

Time-Saving Effects of FFT-Based EMI Measurements

EMI measurements for RF/microwave testing are complex and time-consuming. While signal processing advancements help, key improvements come from enhanced software, integration, automation, and time-domain techniques like FFT, making the EMC measurement process faster and more efficient.

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EMC Test Site Qualifications: Site Voltage Standing Wave Ratio versus Time Domain Reflectometry

This article addresses the critical question of which method—SVSWR or TDR—more accurately assesses a test site. Given the investments companies make in test sites for EMC compatibility, this is a key assessment question.

The Application of Time Domain Measurements

Despite the many benefits of using the TDR method for site validation, as an accredited test laboratory we are compelled to also perform site validation measurements using the CISPR 16-1-4 SVSWR method.

Free Space Antenna Factors Through the Use of Time-Domain Signal Processing

The term free-space implies that there is no electromagnetic interaction between the test environment and the antenna.

S-parameter Data Correction Using Time Domain Gating for PCB and Cable Applications

This paper describes how to remove the measurement artifacts caused by discontinuities in high frequency S-parameter data caused by the test connectors on the Printed Circuit Boards (PCBs) and cables. The frequency domain S-parameters are converted to the time domain to get the impulse response. Time domain gating is then used on this impulse response to remove reflections due to end connectors and/or other discontinuities. The gated impulse response is then transformed back to the frequency domain. The final result is a much improved S-parameter data set with unwanted resonance removed, allowing the PCB trace or cable loss to be determined.

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