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Questions to Ask When Purchasing Fiberoptic Links and Camera Systems Used for EMC Testing

EMI-shielded fiber optic links and cameras are revolutionizing EMC testing by ensuring accurate data transfer, real-time monitoring, and reliable analysis in the presence of electromagnetic interference.

Return-Current Distribution in a PCB Microstrip Line Configuration, Part 1

This is the first article of a two-article series devoted to the return current distribution in a 2-layer FR-4 PCB microstrip line configuration with a solid reference plane.

Can Electrostatic Discharge Design Problems Be Solved with Electronic Design Automation Tools Alone? Part 1

Going back several decades, Electrostatic Discharge (ESD) design and layout checks that were done manually were laborious and time-consuming, let alone not confidently reliable.

Locating the Noise Source of the 10-30 MHz “Hump”

During conducted emission tests, one of the challenges manufacturers face is the resonance peaks in the harmonic noise somewhere between 10 MHz and 30 MHz. Often, no amount of filtering will eradicate or attenuate the peak.

Cavity Resonances of Shielding Boxes and Cans

Many years ago, the author experimented on a metal enclosure of one of his company’s main products. The experiment involved placing an electric field probe inside the empty metal enclosure (no electronics inside) and applying 10 V/m using the IEC 61000-4-3 radiated RF immunity test system.
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Questions to Ask Before Purchasing a TEM Cell or GTEM Cell

When it comes to conducting electromagnetic compatibility (EMC) testing, TEM (Transverse ElectroMagnetic) cells and GTEM (GigaHertz Transverse ElectroMagnetic) cells are widely used for their ability to generate controlled and repeatable test environments.

Far-Field Criterion for Wire‑Type Antennas

This article presents the derivation of the far-field criterion for two fundamental wire-type antennas: electric (or Hertzian) dipole and magnetic dipole.

The Dilemma Between Customers and Suppliers on EOS Failures

During the last four decades, damage to devices from electrical overstress (EOS) has confounded both IC suppliers and customers. The Industry Council on ESD Target Levels investigated numerous EOS root causes and established a white paper on the subject, JEP174 [1].

ANSI Z535.1 – Safety Colors in Focus

In our "On Your Mark" columns, we often discuss the importance of American National...

Banana Skins – July 2023 (#429-432)

One car manufacturer found that the craze for CB radio caused more than a jamming of the airwaves.
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