Resources

If pre-compliance activities are good for discovering EMC design weaknesses early in product development, why not apply the same thought process to product safety?

Spectrum analyzers are usually the tool of choice for troubleshooting CE or RE. In recent years, the cost of a basic analyzer has dropped markedly. However, the more expensive lab-quality analyzers will have advanced measurement features that may be worth considering.

This article evaluates the impact of decoupling capacitors and trace length on radiated emissions.

February 29th may not be considered a holiday, but rather a quirky day we don't know what to do with every four years. However, the thinking that produced leap years does represent creativity we continue relying upon today.

Greetings. I am Patrick André, an independent EMC consultant in the Pacific Northwest. Having...

This blog explains CDM ESD testing using the field-induced (FI) method, which is important for semiconductor manufacturers. It covers building a CDM-FI tester, waveform details and verification, and qualification nuances. 

This month's blog explains X-type capacitors, which suppress emissions in switch-mode power supplies and variable drives.

As a product designer, a major issue you'll face is radiated emissions. This month, we'll outline the basic tools to characterize and mitigate radiated emissions at your workbench. This summarizes the fundamental test equipment to identify sources of harmonic noise and characterize radiated emissions.

This column describes the operation of an ideal difference amplifier. It is shown that an ideal difference amplifier (with no resistance mismatches) eliminates the common mode portion of the input voltage and amplifies only the differential mode portion of the input voltage.

The behavior of ultra-high-speed interfaces is complex, involving fast-rise time waveforms and on-die transient phenomena that cause device failure at lower CDM levels.