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Expert Insights

EMC Bench Notes: How to Use Spectrum Analyzers for EMC

Spectrum analyzers are usually the tool of choice for troubleshooting CE or RE. In recent years, the cost of a basic analyzer has dropped markedly. However, the more expensive lab-quality analyzers will have advanced measurement features that may be worth considering.

Impact of Decoupling Capacitors and Trace Length on Radiated Emissions in a CMOS Inverter Circuit

This article evaluates the impact of decoupling capacitors and trace length on radiated emissions.

A New Day is Born: The Creation of February 29th

February 29th may not be considered a holiday, but rather a quirky day we don't know what to do with every four years. However, the thinking that produced leap years does represent creativity we continue relying upon today.

Military and Aerospace EMC: What is the RTCA?

Greetings. I am Patrick André, an independent EMC consultant in the Pacific Northwest. Having...

Product Insights: Charged Device Model ESD Testing

This blog explains CDM ESD testing using the field-induced (FI) method, which is important for semiconductor manufacturers. It covers building a CDM-FI tester, waveform details and verification, and qualification nuances. 
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Practical Engineering: X1 vs X2 Capacitor Types and How to Select the Correct Type

This month's blog explains X-type capacitors, which suppress emissions in switch-mode power supplies and variable drives.

EMC Bench Notes: Some Starting Tools

As a product designer, a major issue you'll face is radiated emissions. This month, we'll outline the basic tools to characterize and mitigate radiated emissions at your workbench. This summarizes the fundamental test equipment to identify sources of harmonic noise and characterize radiated emissions.

Difference Amplifier: Common Mode and Differential Mode Voltages

This column describes the operation of an ideal difference amplifier. It is shown that an ideal difference amplifier (with no resistance mismatches) eliminates the common mode portion of the input voltage and amplifies only the differential mode portion of the input voltage.

Challenges of CDM Modeling for High-Speed Interface Devices

The behavior of ultra-high-speed interfaces is complex, involving fast-rise time waveforms and on-die transient phenomena that cause device failure at lower CDM levels.

Using a Near-Field Probe to Troubleshoot Transient Failures

Solving EMI problems isn’t only about ensuring that a product can meet EMC regulations and standards (although it’s a significant part of the job). Another crucial reason for addressing EMI issues is to enhance product reliability, especially when a product operates in public or industrial areas where there are many different types of noise sources.
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