Columns

This article presents the derivation of the far-field criterion for two fundamental wire-type antennas: electric (or Hertzian) dipole and magnetic dipole.

During the last four decades, damage to devices from electrical overstress (EOS) has confounded both IC suppliers and customers. The Industry Council on ESD Target Levels investigated numerous EOS root causes and established a white paper on the subject, JEP174 [1].

In our "On Your Mark" columns, we often discuss the importance of American National...

One car manufacturer found that the craze for CB radio caused more than a jamming of the airwaves.

This article explains how to use a Smith Chart to determine the input impedance to transmission line at a given distance from the source or the load.

In this article we discuss the MOS transistor in the role of ESD protection for high-voltage applications and take a look into a possible future of ESD protection devices for high-performance computing applications.

Spacecraft now and of the future are being controlled by EMC requirements of the past.

This is the second of the three articles devoted to the topic of a Smith Chart.

As long as integrated circuits migrate to new technologies and advances are made in packaging more integrated circuit dies into a single package, the CDM challenge is going to get harder.

In this column, we discuss several important features of a spectrum analyzer not covered in previous articles that are worth your consideration.