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ANSI Z535.3 – Safety Symbols in Focus

The ANSI Z535.3 standard focuses solely on guidelines for the design and use of safety symbols.

Banana Skins – October 2023 (#433-436)

The paper machine process requires precise control of the paper sheet tension as it progresses through the machine.

2023 Ig Nobel Prizes Announced

An annual tradition here at In Compliance Magazine, we’re pleased to announce the winners...

Return-Current Distribution in a PCB Microstrip Line Configuration, Part 2

This is the second article of a two-article series devoted to the return current distribution in a PCB microstrip line configuration.

Can Electrostatic Discharge Design Problems Be Solved with Electronic Design Automation Tools Alone? Part 2

In Part 1 of the article, we reviewed what EDA tools are good for. Here we will discuss EDA tool limitations.
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Return-Current Distribution in a PCB Microstrip Line Configuration, Part 1

This is the first article of a two-article series devoted to the return current distribution in a 2-layer FR-4 PCB microstrip line configuration with a solid reference plane.

Can Electrostatic Discharge Design Problems Be Solved with Electronic Design Automation Tools Alone? Part 1

Going back several decades, Electrostatic Discharge (ESD) design and layout checks that were done manually were laborious and time-consuming, let alone not confidently reliable.

Locating the Noise Source of the 10-30 MHz “Hump”

During conducted emission tests, one of the challenges manufacturers face is the resonance peaks in the harmonic noise somewhere between 10 MHz and 30 MHz. Often, no amount of filtering will eradicate or attenuate the peak.

Far-Field Criterion for Wire‑Type Antennas

This article presents the derivation of the far-field criterion for two fundamental wire-type antennas: electric (or Hertzian) dipole and magnetic dipole.

The Dilemma Between Customers and Suppliers on EOS Failures

During the last four decades, damage to devices from electrical overstress (EOS) has confounded both IC suppliers and customers. The Industry Council on ESD Target Levels investigated numerous EOS root causes and established a white paper on the subject, JEP174 [1].
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