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Columns

Banana Skins – January 2018 (#1-19)

We are pleased to bring you Banana Skins, a new monthly column in In Compliance, and a 20-year tradition that began in the pages of the EMC Journal.

Radiated Emissions Measurements: OATS and ALSE Methods

This article is devoted to the radiated emissions measurements. These measurements can be performed either at the Open Area Test Site (OATS) or in an Absorber-Lined Shielded Enclosure (ALSE).

Automated Handling Equipment

How is automated handling equipment treated under an S20.20 compliant ESD program?

Snubbers to Kill Parasitic Resonances

Snubbers are RC networks that are really useful for protecting components (transistors, diodes, etc.) and reducing EMI, especially in switching applications.

Standing Waves on Transmission Lines and VSWR Measurements

The article discusses the behavior of voltage and current waves on a transmission line with different types of loads and explains how to measure the VSWR of an antenna.
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Hi-Pot Test Current, Leakage Current and Insulation Resistance

Can the hi-pot test and the insulation resistance test be combined into a single measurement? Let’s discuss each of these parameters as circuit parameters and as safety parameters.

Latch-up Electronic Design Automation Checks

Circuit design reliability verification in Integrated Circuit (IC) design is extremely challenging.

Audio Rectification and TDMA/GSM EMI

RF signals entering in a system and being rectified can interfere seriously. That has been classically the case of audio noise in speakers because of mobile phones using TDMA technology. The problem is now very common in products with wireless RF funcionality in products with audio areas.

Conducted Emissions Measurements: Current Method

This article is devoted to the current method of the conducted emissions measurements.

More on the 25-Amp Grounding Impedance Test

For production-line testing, the 25- or 30-amp grounding continuity test is not likely to identify construction anomalies that would not also be identified by a simple low-current test.
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