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Hot Topics in ESD

Next Generation Charged Device Model ESD Testing

Charged Device Model testing faces a reliability crisis as qualification levels drop below 250V. Legacy air spark methods become increasingly variable at lower voltages, while emerging relay-based alternatives offer consistent results without sacrificing correlation—a critical evolution for next-generation semiconductor qualification.

Transmission Line Pulse Testing: The Indispensable Tool for ESD Characterization of Devices, Circuits and Systems

Discover how engineers test electronic device resilience using Transmission Line Pulse testing, uncovering the critical science that protects our most sensitive technologies from catastrophic electrical failures.

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