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Hot Topics in ESD

Machine Learning Applications in the Novel ESD Compact Modeling Methodology

This column explores the application of machine learning techniques in ESD compact modeling for semiconductor devices. It compares traditional methods with a new machine learning approach, highlighting improved efficiency and accuracy in predicting ESD protection performance.

Are ESD & ESA Controls in place in Semiconductor Wafer Fabs?

This text discusses ESD/ESA control in semiconductor fabs, highlighting challenges with S20.20 certification, the importance of grounding conductive materials, managing insulative materials, and using ionization for charge neutralization in wafer manufacturing processes.

What’s New in ESD Control Standards?

Standards continuously evolve, and EOS/ESD Association, Inc. standards are no different. The ESDA is always striving to achieve the highest quality standards.

Does An ESD Control Program Require Humidity Controls?

Humidity control in relation to an ESD control program continues to be misunderstood across the industry. Humidity does help in the reduction of charge accumulation, but it does not control charge accumulation to reduce the risk to sensitive items.

Modeling the RF Switch Front End Module ESD Protection

The article discusses ESD protection challenges for RF switches in SOI technology. It examines the self-protection mechanism, proposes a behavioral model to simulate ESD response more accurately, and explores predicting failure current levels critical for reliable ESD design.
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Voltage to Current Correlation for CDM Testing

It is now well known that testing for CDM ESD evaluation is becoming a bigger challenge. An alternate approach called capacitively coupled transmission line pulsing (CCTLP) offers advantages over standard field-induced CDM testing.

The ESD Association Technology Roadmap

The ESDA technology roadmap is written to support and guide the daily work of ESD and latch-up experts in the worldwide industry and academia.

Challenges of CDM Modeling for High-Speed Interface Devices

The behavior of ultra-high-speed interfaces is complex, involving fast-rise time waveforms and on-die transient phenomena that cause device failure at lower CDM levels.

Integrating Embedded ESD Detection, Part 3

This column outlines the steps to consider when embedding ESD detection capabilities into your system and overall design flow.

Implementing Embedded ESD Detection, Part 2

This column focuses on the practical aspects of implementing embedded ESD detection. We’ll provide a step-by-step guide, discuss validation and testing methodologies, present case studies, and delve into future trends and innovations in the field.
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