Hot Topics in ESD

This column explores the significant impact of artificial intelligence on advancements in silicon fabrication, focusing on the development of high bandwidth memory (HBM) and associated die-to-die(D2D) electrostatic discharge (ESD) protection challenges.

This column explores the application of machine learning techniques in ESD compact modeling for semiconductor devices. It compares traditional methods with a new machine learning approach, highlighting improved efficiency and accuracy in predicting ESD protection performance.

This text discusses ESD/ESA control in semiconductor fabs, highlighting challenges with S20.20 certification, the importance of grounding conductive materials, managing insulative materials, and using ionization for charge neutralization in wafer manufacturing processes.

Standards continuously evolve, and EOS/ESD Association, Inc. standards are no different. The ESDA is always striving to achieve the highest quality standards.

Humidity control in relation to an ESD control program continues to be misunderstood across the industry. Humidity does help in the reduction of charge accumulation, but it does not control charge accumulation to reduce the risk to sensitive items.

The article discusses ESD protection challenges for RF switches in SOI technology. It examines the self-protection mechanism, proposes a behavioral model to simulate ESD response more accurately, and explores predicting failure current levels critical for reliable ESD design.

It is now well known that testing for CDM ESD evaluation is becoming a bigger challenge. An alternate approach called capacitively coupled transmission line pulsing (CCTLP) offers advantages over standard field-induced CDM testing.

The ESDA technology roadmap is written to support and guide the daily work of ESD and latch-up experts in the worldwide industry and academia.

The behavior of ultra-high-speed interfaces is complex, involving fast-rise time waveforms and on-die transient phenomena that cause device failure at lower CDM levels.

This column outlines the steps to consider when embedding ESD detection capabilities into your system and overall design flow.