EMC Concepts Explained

This part II of the s-parameter tutorial presents several examples of the s-parameter use in EMC measurements and testing.

This s-parameters tutorial consists of two parts: Part I discusses the fundamental background needed to understand the concept of s-parameters; Part II explains the s-parameters use in EMC measurements and testing

This article examines the spread-spectrum frequency dithering technique to reduce the EMI noise from a SMPS.

This column explores the conducted immunity test known as a Bulk Current Injection (BCI) test, according to ISO 11452-4 specification.

This article discusses a practical approach to designing an input filter to the switch-mode power supply (SMPS).

We compare the shielding effectiveness of various solid metallic shields by direct H-field measurements in the near field of the source.

In this article we investigate the frequency behavior of a ceramic capacitor.

This article discusses the crosstalk reduction between PCB traces by utilizing a guard trace between the traces and investigating the effect of the guard trace grounding.

When two circuits share a return path with non-zero impedance, the result is common-impedance coupling — and real EMC problems. This foundations piece breaks down the theory with circuit models, then backs it up with lab measurements showing how ground impedance affects audio, video, and high-current circuits sharing a common return path.

From open fields to shielded enclosures, radiated emissions testing demands precision at every step — this technical deep dive compares OATS and ALSE measurement methods, antenna configurations, and FCC and CISPR compliance limits across a broad frequency spectrum.