Blogs

This blog explains CDM ESD testing using the field-induced (FI) method, which is important for semiconductor manufacturers. It covers building a CDM-FI tester, waveform details and verification, and qualification nuances. 

This month's blog explains X-type capacitors, which suppress emissions in switch-mode power supplies and variable drives.

As a product designer, a major issue you'll face is radiated emissions. This month, we'll outline the basic tools to characterize and mitigate radiated emissions at your workbench. This summarizes the fundamental test equipment to identify sources of harmonic noise and characterize radiated emissions.

To avoid costly errors in selection, invest the time upfront to gain a basic yet thorough grasp of key amplifier specifications and operating principles before identifying the optimal model for your application needs.

Making time for even just 30 minutes of focused reading each day will keep you on the path of continuous learning.

What if you could confidently characterize and resolve EMC vulnerabilities before they escalate to profit decimation?

Choosing an EMC test lab to work with is one of the most important decisions any electronics design engineer or product developer has to make.

Occasionally, we are asked to help develop shielding effective for near-field low-frequency (LF) magnetic fields, perhaps in a situation where some regulatory agency has imposed limits on LF magnetic field emissions of our product, and we are forced to comply.

Although understanding each capacitor type and behavior is daunting and difficult to memorize, it is prudent that every aspiring engineer and technician involved in design for EMC at least have a rudimentary understanding of what capacitor technologies are available.

To determine a shielding material’s potential absorption loss capability, you must first know the frequency or frequencies of concern and, second, what shield materials you have available.