Columns

This first installment in a two-part series evaluates inductor impedance using S11 parameters across one-port shunt, two-port shunt, and two-port series methodologies. Experimental results reveal significant discrepancies between measured values and manufacturer specifications, highlighting limitations in S11-based impedance characterization techniques.

The teaser maintains a technical, authoritative tone that should appeal to engineering professionals while highlighting the article's key experimental findings. It addresses the misconceptions about AC ionizer safety and emphasizes the quantitative approach taken in the study, which should generate interest among readers concerned with ESD protection in semiconductor manufacturing environments.

This article explores S₂₁ parameter methods for measuring capacitor impedance. Comparing two-port shunt and series techniques with established benchmarks reveals the two-port shunt method delivers superior accuracy across multiple capacitor values and frequency ranges.

By understanding resistance in discharge circuits, engineers can implement effective protection through grounding, dissipative materials, and equipotential bonding—creating comprehensive ESD control programs that safeguard sensitive electronic components.

Ever wonder how accurate your capacitor measurements really are? This deep dive into network analyzer techniques compares three different methods for measuring impedance, uncovering surprising limitations in standard s₁₁ parameter approaches that engineers should know about.

Why do you get zapped touching a doorknob? Dive into the science of static electricity, from atomic-level charge separation to the surprising role of humidity. This practical guide reveals how static builds up and what it means for protecting sensitive electronics.

Got a noisy power system? This real-world EMI investigation reveals how seemingly minor grounding issues between compartments can create major interference problems - and shows how smart measurement techniques led to an elegant fix.

Discover how a unique collaboration between Grand Valley State University and E3 Compliance creates exceptional learning opportunities in EMC and high-speed electronics. Learn how students gain hands-on industry experience through co-op programs, research projects, and real-world testing, preparing them for successful careers in electromagnetic compatibility.

Explore innovations in transistor scaling technology with a focus on backside power delivery networks. This technical analysis examines how extremely thinned silicon substrates impact ESD protection in advanced semiconductor devices, offering solutions for maintaining reliability in next-generation chip designs.

This is the third and final article discussing four different circuit models of transmission lines in sinusoidal steady state. This article uses Model 4 to determine the locations of the minima and maxima of standing waves. This determination is first done analytically, followed by the graphical method using the Smith chart.