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Columns

Analysis of Transmission Lines in Sinusoidal Steady State: Part 2

This column continues a series on transmission line circuit models, exploring two additional models. It derives equations for voltage characteristics and standing waves, building upon concepts introduced in the previous installment.

Machine Learning Applications in the Novel ESD Compact Modeling Methodology

This column explores the application of machine learning techniques in ESD compact modeling for semiconductor devices. It compares traditional methods with a new machine learning approach, highlighting improved efficiency and accuracy in predicting ESD protection performance.

Using Near-Field Probes to Troubleshoot Radiated Immunity Failures

This Column discusses a technique for troubleshooting radiated immunity failures in electronic devices using near-field probes. It presents a case study, explains the method's application, and addresses its limitations and safety considerations for bench-level testing.

Banana Skins – November 2024 (#454-459)

The month's Banana Skins covers various electromagnetic interference issues in different contexts. It discusses problems with video projectors affecting audio induction loops, switch-mode power supply emissions varying with voltage, hybrid vehicle EM emissions, computer interference with amateur radio, electrostatic discharge in fluid lines, and communication equipment in ambulances causing radio interference.

Analysis of Transmission Lines in Sinusoidal Steady State: Part 1

This article discusses two of four circuit models for transmission lines in sinusoidal steady state. Model 1 is used for solving equations, while Model 2 introduces standing waves. The author explains their applications and differences.
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Are ESD & ESA Controls in place in Semiconductor Wafer Fabs?

This text discusses ESD/ESA control in semiconductor fabs, highlighting challenges with S20.20 certification, the importance of grounding conductive materials, managing insulative materials, and using ionization for charge neutralization in wafer manufacturing processes.

Implementing “Wordless” Safety Labels

This column discusses "wordless" safety labels, which use symbols and hazard severity panels without text. It explores their benefits, limitations, and implementation considerations, emphasizing the importance of balancing complete information with clear communication in product safety warnings.

Smith Chart and Voltage Standing Wave Ratio

This article explains how to use a Smith Chart to determine the voltage standing wave ratio (VSWR).

What’s New in ESD Control Standards?

Standards continuously evolve, and EOS/ESD Association, Inc. standards are no different. The ESDA is always striving to achieve the highest quality standards.

Common-Impedance Coupling

Explore the impact of the return path impedance and the return current level on common-impedance coupling between circuits. The measurements presented were performed on a custom PCB containing audio, video, and high-current circuitry, where the return paths for each circuit were selectively shared with other circuits.
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