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Hi-Pot Test Current, Leakage Current and Insulation Resistance

Can the hi-pot test and the insulation resistance test be combined into a single measurement? Let’s discuss each of these parameters as circuit parameters and as safety parameters.

Latch-up Electronic Design Automation Checks

Circuit design reliability verification in Integrated Circuit (IC) design is extremely challenging.

Audio Rectification and TDMA/GSM EMI

RF signals entering in a system and being rectified can interfere seriously. That has been classically the case of audio noise in speakers because of mobile phones using TDMA technology. The problem is now very common in products with wireless RF funcionality in products with audio areas.

Conducted Emissions Measurements: Current Method

This article is devoted to the current method of the conducted emissions measurements.

More on the 25-Amp Grounding Impedance Test

For production-line testing, the 25- or 30-amp grounding continuity test is not likely to identify construction anomalies that would not also be identified by a simple low-current test.
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Graphically Conveying Complex Safety Messages

As the person responsible for your product’s safety labels, you might run into this problem: you want to convey your message in “symbol-only” form because your intended audience is global and yet your safety message is fairly complex.

Current Probe Measurements in EMC Testing

This article focuses on the current probes used in EMC measurements and testing.

The 25-Amp Grounding Impedance Test

High-current grounding impedance tests have been specified in safety standards for many years. There are two, independent sources for these tests.

Hidden Start-up Events

Whenever an electronic circuit is first energized, transients occur in current and voltage waveforms. These start-up transients can affect the electrical and thermal behavior of components and circuits with serious reliability, EMI, and random effects. Try to characterize how your circuits start and stop.

Thermo Fisher Scientific – Booth 425

With critical electronics, failure is not an option. Visit us in Booth 425 to learn...
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