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Banana Skins – October 2022 (#397-403)

During the testing of one aircraft, we suffered a very marked and complete electrical failure of the aircraft (much to the alarm of both the test engineers and the cockpit crew) which turned out to be due to the EUT we were testing.

Eye Diagram

This article addresses the impact of driver, HDMI cable, and receiver on signal quality using data eye, based on the following criteria: data eye opening, data mask violation, and data jitter.

Industry Council’s Latch‑up Survey

This article provides a high-level overview of the Industry Council paper “Survey on Latch‑up Testing Practices and Recommendations for Improvements,” which describes the full analysis of the collected responses and lays a path for potential adaptations needed to accommodate its use in future technologies and applications.

Eye Diagram

This is the first of two articles devoted to an eye diagram. In this article, the fundamental definitions and concepts are presented.

Cable Antennas and Ferrite Cores

In this column, the author offers a brief summary of a more systematic approach for using ferrite cores on cables. This summary can serve as a “ferrite core checklist” for design and test engineers.

Latch-up Electronic Design Automation Checks

This article introduces typical latch-up verification techniques to detect and prevent latch-up. These techniques rely on electronic design automation (EDA) tools to deliver the coverage necessary to identify and eliminate latch-up risks. 

ANSI Z535 In Focus

This year, 2022, is a revision cycle year for ANSI Z535, and it marks the first time many of the standards have changed in over a decade. This month’s column explores the latest updates and what they mean for product safety.
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