Design

The electronic industry has embraced simulation to address several complex design challenges, but reliability is still mostly dealt with best design practices and tested with prototypes. In this article, we present how modeling and simulation approaches can help designers perform virtual prototyping and uncover reliability issues especially EOS/ESD before going for physical prototypes.

How is the proper ESD Protection Cell chosen for a particular design application?

This article discusses the distribution of a PCB return current underneath top trace for the microstrip configuration. Next month’s article will discuss the distribution for the stripline configurations.

In Part 2 of this two-part article, we’ll discuss the development and use of isolated bonding networks (IBNs).

In Part 1 of this two-part article, we’ll discuss the development of “grounding networks” and the shift to meshed structures to reduce damage from overvoltages. Part 2 will appear in our November 2020 issue.

This article reviews some of the ESD protection design challenges when designing in a FinFET technology and give an outlook on the successors of FinFET.

This article is about varistor construction, characteristics, testing and the often-unappreciated ways varistors can fail.

This article provides an overview of current standards applicable to rechargeable lithium and lithium-ion batteries.

Are you just getting into software simulation and feeling a little overwhelmed with all the new jargon? This brief article will explain some of the most common terms used in the very exciting world of EMC/Signal Integrity simulation software, all in one location.

Robust ESD protection does not ensure that IC designs are protected from unintended EOS effects. This article identifies areas of risk in some ESD design methods.